| title | media type | ISBN-13 | year of publica- tion | other author(s) |
|---|---|---|---|---|
| Charged Semiconductor Defects: Structure, Thermodynamics and Diffusion | Hardcover | 978-1-84882-058-6 | 2008 | Meredith C. Kratzer |
| Fundamentals of Ethics: For Scientists and Engineers | Paperback | 978-0-19-513488-9 | 2001 | Robert L. Barry |
| Ion Implantation Technology: 17th International Conference on Ion Implantation Technology | CD-ROM | 978-0-7354-0634-6 | 2009 | Susan B. Felch · Amitabh Jain · Yevgeniy V. Kondratenko |
| Ion Implantation Technology: 17th International Conference on Ion Implantation Technology | Hardcover | 978-0-7354-0597-4 | 2008 | Susan B. Felch · Amitabh Jain · Yevgeniy V. Kondratenko |
E. G. ?? · E.G.S. · Edmund G · Edmund G. Seebauer and Robert L. Barry · G S
American Institute of Physics · Oxford University Press · Springer