Charged Semiconductor Defects: Structure, Thermodynamics and Diffusion (Engineering Materials and Processes)

by: Edmund G. Seebauer · Meredith C. Kratzer Hardcover details (United Kingdom). details (Italy). (see also: Copertina rigida) ISBN: 978-1-84882-058-6 ISBN-10: 1-84882-058-5 Springer · 2008