Yervant Zorian

Springer · Wiley

titlemedia type ISBN-13year of publica-
tion
other author(s)
Collaboration and Technology: 21st International Conference, CRIWG 2015, Yerevan, Armenia, September 22-25, 2015, ProceedingsTaschenbuch
978-3-319-22746-72015Nelson Baloian · Perouz Taslakian · Samvel Shoukouryan
Embedded Processor-Based Self-TestPaperback 978-1-4419-5252-32011Dimitris Gizopoulos · A. Paschalis
Embedded Processor-Based Self-TestHardcover 978-1-4020-2785-72004Dimitris Gizopoulos · A. Paschalis
Multi-Chip Module Test Strategies   " 978-0-7923-9920-91997
Principles of Testing Electronic Systems   " 978-0-471-31931-32000Samiha Mourad

 

Yette Zens