title | media type | ISBN-13 | year of publica- tion | other author(s) | |
---|---|---|---|---|---|
Electron Nano-Imaging: Basics of Imaging and Diffraction for TEM and STEM | Paperback | 978-4-431-56804-9 | 2018 | ||
Electron Nano-Imaging: Basics of Imaging and Diffraction for TEM and STEM | ハードカバー | 978-4-431-56500-0 | 2017 | ||
Monolithic Silicas in Separation Science: Concepts, Syntheses, Characterization, Modeling and Applications | Gebunden | 978-3-527-32575-7 | 2011 | Klaus K. Unger · Egidijus Machtejevas | |
Scanning Transmission Electron Microscopy of Nanomaterials: Basics, Present Status and Future Prospects | Hardcover | 978-1-84816-789-6 | 2014 |
Imperial College Press · Springer · Wiley-VCH