LAP LAMBERT Academic Publishing · Springer
| title | media type | ISBN-13 | year of publica- tion | other author(s) |
|---|---|---|---|---|
| Bias-Temperature-Instabilities in MOSFETs with high-k dielectrics: Electrical behavior, modeling and process impact under Bias Temperature stress in high-k metal gated MOSFETs | Taschenbuch | 978-3-8383-6404-9 | 2010 | Marc Aoulaiche · Herman Maes |
| ESD Protection Challenges: FinFET Technology and RF CMOS Circuits | " | 978-3-8383-3642-8 | 2010 | Steven Thijs |
| Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications | Paperback | 978-94-024-0205-6 | 2016 | Jacopo Franco · Ben Kaczer |
| Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications | Hardcover | 978-94-007-7662-3 | 2013 | Jacopo Franco · Ben Kaczer |
g G · Guido Gerken · Guido Gryczan · Guido Guerzoni · Guita Garakani