title | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) |
---|---|---|---|
Frontiers of Characterization and Metrology for Nanoelectronics: 2009 | 978-O-7354-O712-1 (O-7354-O712-6) | 2009 | David G. Seiler · Alain C. Diebold · Robert McDonald · Dan Herr · Rajinder P. Khosla · Erik M. Secula |
C. G. · C.M. · C. Michael · M G*** · Michael G. · Michael Garner