C. Michael Garner

titleISBN-13
(ISBN-10)
year of publica-
tion
other author(s)
Frontiers of Characterization and Metrology for Nanoelectronics: 2009978-O-7354-O712-1
(O-7354-O712-6)
2009David G. Seiler · Alain C. Diebold · Robert McDonald · Dan Herr · Rajinder P. Khosla · Erik M. Secula

C. G. · C.M. · C. Michael · M G*** · Michael G. · Michael Garner

C. Michael Gibson