Ben Kaczer

Beny Kiser

titlemedia typeISBN-13
(ISBN-10)
year of publica-
tion
other author(s)
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS ApplicationsPaperback978-94-024-0205-6
(94-024-0205-5)
2016Jacopo Franco · Guido Groeseneken
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS ApplicationsHardcover978-94-007-7662-3
(94-007-7662-4)
2013Jacopo Franco · Guido Groeseneken

Ben Kaden