| title | ISBN-13 (ISBN-10) | year of publica- tion | other author(s) |
|---|---|---|---|
| A Unified Approach for Timing Verification and Delay Fault Testing | 978-0-7923-8079-5 (0-7923-8079-7) | 1997 | Mukund Sivaraman |
| VLSI Design for Manufacturing: Yield Enhancement | 978-0-7923-9054-1 (0-7923-9054-7) | 1989 | Stephen W. Director · Wojciech Maly |