Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (SpringerBriefs in Applied Sciences and Technology)

by Nicolas Brodusch Paperback details (United States). (see also: eBook (Kindle)) details (United Kingdom). (see also: eBook (Kindle)) details (Germany). (see also: Kindle Ausgabe) details (Spain - España). (see also: Versión Kindle) ISBN: 978-981-10-4432-8 ISBN-10: 981-10-4432-5 Springer · 2017